Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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12/19/2017
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Application #:
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15079062
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Filing Dt:
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03/24/2016
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Publication #:
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Pub Dt:
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09/28/2017
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Inventor:
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Weiwen ZOU
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Title:
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FAST DENSITY ESTIMATION METHOD FOR DEFECT INSPECTION APPLICATION
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 5/F, PHOTONICS CENTRE, 2 SCIENCE PARK WEST AVENUE |
| HONG KONG SCIENCE PARK, SHATIN, NEW TERRITORIES |
| HONG KONG, CHINA |
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| WAI HON YAN |
| 5001 HOPEWELL CENTRE |
| 183 QUEEN'S ROAD EAST |
| WAN CHAI, HONG KONG |
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