Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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01/02/2018
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Application #:
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15515227
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Filing Dt:
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03/29/2017
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Publication #:
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Pub Dt:
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08/03/2017
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Inventors:
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Mayeul DURAND DE GEVIGNEY, Philippe GASTALDO
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Title:
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METHOD AND SYSTEM FOR INSPECTING WAFERS FOR ELECTRONICS, OPTICS OR OPTOELECTRONICS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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611 RUE ARISTIDE BERGÈS |
ZAC DE PRÉ MILLET |
MONTBONNOT-SAINT-MARTIN, FRANCE F-38330 |
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GREER, BURNS & CRAIN, LTD. |
300 SOUTH WACKER DRIVE |
SUITE 2500 |
CHICAGO, IL 60606 |
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09/20/2024 06:31 AM
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