Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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03/13/2018
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Application #:
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14814959
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Filing Dt:
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07/31/2015
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Publication #:
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Pub Dt:
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02/02/2017
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Inventors:
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Shih-Wei Hung, Chien-Feng Lin, Zheng-Yang Pan, Shu Kuan
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Title:
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Method for Detecting Presence and Location of Defects in a Substrate
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NO. 8, LI-HSIN RD. 6 |
| SCIENCE-BASED INDUSTRIAL PARK |
| HSIN-CHU, TAIWAN 300-77 |
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| SLATER & MATSIL, L.L.P. |
| 17950 PRESTON ROAD, SUITE 1000 |
| DALLAS, TX 75252 |
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