Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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05/08/2018
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Application #:
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15151748
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Filing Dt:
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05/11/2016
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Publication #:
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Pub Dt:
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11/16/2017
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Inventors:
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Chien-Kuo Wang, Wen-Jung Liao, Chun-Liang Hou
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Title:
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SEMICONDUCTOR STRUCTURE AND TESTING METHOD USING THE SAME
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NO3, LI-HSIN RD.II, HSINCHU SCIENCE PARK |
| HSINCHU, TAIWAN 30078 |
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| WPAT, PC INTELLECTUAL PROPERTY ATTORNEYS |
| 8230 BOONE BLVD, SUITE 405 |
| VIENNA, VA 22182 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| BRACKEN ROAD, SANDYFORD |
| FIRST FLOOR, BLACKTHORN EXCHANGE |
| DUBLIN, IRELAND D18 P3Y9 |
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| LONGITUDE LICENSING LTD |
| BRACKEN ROAD, SANDYFORD |
| FIRST FLOOR, BLACKTHORN EXCHANGE |
| DUBLIN, D18 P3Y9 IRELAND |
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