Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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02/11/2003
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Application #:
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09739788
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Filing Dt:
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12/20/2000
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Publication #:
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Pub Dt:
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06/21/2001
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Inventor:
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Seiji Miyagawa
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Title:
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METHOD OF CHECKING EXPOSURE PATTERNS FORMED OVER PHOTO-MASK
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 7-1, SHIBA 5-CHOME, MINATO-KU |
| TOKYO, JAPAN |
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| YOUNG & THOMPSON |
| ISIAH AVILA |
| SECOND FLOOR |
| 745 SOUTH 23RD STREET |
| ARLINGTON, VA 22202 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1753 SHIMONUMABE NAKAHARA-KU, KAWASAKI |
| KANAGAWA 211-8668, JAPAN |
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| YOUNG & THOMPSON |
| RONALD E. LONG, JR. |
| 745 SOUTH 23RD STREET |
| ARLINGTON, VA 22202 |
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