Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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NONE
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Issue Dt:
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Application #:
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09735214
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Filing Dt:
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12/12/2000
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Publication #:
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Pub Dt:
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12/13/2001
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Inventor:
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Jeong-Hoi Koo
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Title:
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Defect analysis method in image sensor device
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| SAN 136-1, AMI-RI, BUBAL-EUB, ICHON-SHI |
| KYOUNGKI-DO, KOREA, REPUBLIC OF 467-8 |
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| TOWNSEND AND TOWNSEND AND CREW LLP |
| BABAK S. SANI |
| TWO EMBARCADERO CENTER, 8TH FLOOR |
| SAN FRANCISCO, CALIFORNIA 94111-3834 |
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Assignment:
2
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CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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| SAN 136-1, AMI-RI, BUBAL-EUB, |
| ICHON-SHI |
| KYOUNGKI-DO, KOREA, REPUBLIC OF |
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| BLAKELY, SOKOLOFF, TAYLOR & AZFMAN |
| ERIC S. HYMAN |
| 12400 WILSHIRE BOULEVARD |
| SEVENTH FLOOR |
| LOS ANGELES, CA 90025 |
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Assignment:
3
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1 HYANGJEONG-DONG, HEUNGDUK |
| CHEONGJU CITY, CHUNG CHEONG BOK-DO, KOREA, REPUBLIC OF |
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| MATTHEW T. SMITH |
| DECHERT LLP |
| 4000 BELL ATLANTIC TOWER |
| 1717 ARCH STREET |
| PHILADELPHIA, PA 19103-2793 |
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