Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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09808673
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Filing Dt:
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03/14/2001
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Publication #:
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Pub Dt:
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03/14/2002
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Inventors:
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Michael Scheidt, Hansruedi Moser, Horst Adams
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Title:
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Method and apparatus for photothermal analysis of a layer of material, especially for thickness measurement thereof
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| INDUSTRIESTRASSE, 22 |
| CH-9450 ALSTATTEN, SWITZERLAND |
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| FENWICK & WEST LLP |
| ALBERT C. SMITH |
| 2 PALO ALTO SQUARE |
| PALO ALTO, CALIFORNIA 94306 |
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