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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
02/18/2003
Application #:
10098641
Filing Dt:
03/15/2002
Publication #:
Pub Dt:
07/25/2002
Inventors:
Jon Opsal, Li Chen
Title:
APPARATUS FOR EVALUATING METALIZED LAYERS ON SEMICONDUCTORS
Assignment: 1
Reel/Frame:
014446/0150Recorded: 07/30/2003Pages: 12
Conveyance:
SECURITY AGREEMENT
Assignor:
Exec Dt:
06/13/2003
Assignee:
3003 TASMAN DR.
SANTA CLARA, CALIFORNIA 95054
Correspondent:
BUCHALTER, NEMER & FIELD & YOUNGER
MRS. KIM WALKER
601 SOUTH FIGUEROA ST., STE. 2400
LOS ANGELES, CA 90017

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