Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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06/01/2004
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Application #:
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10053373
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Filing Dt:
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10/24/2001
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Publication #:
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Pub Dt:
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07/25/2002
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Inventors:
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Jeffrey T. Fanton, Craig Uhrich, Louis N. Koppel
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Title:
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X-RAY REFLECTANCE MEASUREMENT SYSTEM WITH ADJUSTABLE RESOLUTION
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1250 RELIANCE WAY |
| FREMONT, CALIFORNIA 94539 |
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| STALLMAN & POLLOCK LLP |
| BRIAN J. KEATING |
| 121 SPEAR STREET SUITE 290 |
| SAN FRANCISCO, CA 94105 |
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