Patent Assignment Abstract of Title
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Total Assignments:
4
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Patent #:
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Issue Dt:
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04/20/2004
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Application #:
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10125248
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Filing Dt:
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04/18/2002
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Publication #:
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Pub Dt:
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10/24/2002
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Inventors:
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Dong-il Cho, Sangjun Park
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Title:
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PROBE STRUCTURE FOR TESTING SEMICONDUCTOR DEVICES AND METHOD FOR FABRICATING THE SAME
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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INTER-UNIVERSITY SEMICONDUCTOR RESEARCH CENTER (MAIN BUILDING), SEOUL NATIONAL UNIVERSITY |
SAN 56-1, SHINLIM-DONG, GWANAK-GU |
SEOUL 151-742, KOREA, REPUBLIC OF |
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HEAD, JOHNSON & KACHIGIAN |
MARK G. KACHIGIAN |
228 WEST 17TH PLACE |
TULSA, OK 74119 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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#352-9, GOMAE-RI GIHEUNG-EUP |
YONGIN-CITY, 449-901 KYUNGGI-DO, KOREA, REPUBLIC OF |
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SUGHRUE MION, PLLC |
2100 PENNSYLVANIA AVENUE, N.W. |
SUITE 800 |
WASHINGTON, DC 20037 |
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Assignment:
3
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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216, IMOK-DONG, JANGAN-GU |
SUWON-SI, GYEONGGI-DO, KOREA, DEMOCRATIC PEOPLE'S REPUBLIC OF |
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THOMAS M. GALGANO |
20 W. PARK AVENUE, SUITE 204 |
LONG BEACH, NY 11561 |
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Assignment:
4
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CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE'S ADDRESS PREVIOUSLY RECORDED ON REEL 022678 FRAME 0466. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT.
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216, IMOK-DONG, JANGAN-GU |
SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF |
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THOMAS M. GALGANO |
20 W. PARK AVENUE, SUITE 204 |
LONG BEACH, NY 11561 |
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