Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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04/11/2006
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Application #:
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09949111
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Filing Dt:
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09/07/2001
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Publication #:
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Pub Dt:
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11/21/2002
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Inventors:
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Chung-sam Jun, Sang-mun Chon, Hyoung-jin Kim, Dong-chun Lee, Sang-bong Choi, Sung-gon Ryu
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Title:
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WAFER COLOR VARIATION CORRECTING METHOD, SELECTIVE WAFER DEFECT DETECTING METHOD, AND COMPUTER READABLE RECORDING MEDIA FOR THE SAME
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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416, MAETAN-DONG, PALDAL-GU |
SUWON-CITY, KYUNGKI-DO, KOREA, REPUBLIC OF |
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MILLS & ONELLO LLP |
ANTHONY P. ONELLO, JR. |
ELEVEN BEACON ST., SUITE 605 |
BOSTON, MA 02108 |
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