Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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04/25/2006
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Application #:
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10107820
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Filing Dt:
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03/28/2002
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Publication #:
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Pub Dt:
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02/20/2003
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Inventor:
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Kenji Nakayama
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Title:
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METHOD OF DEFECT INSPECTION OF GRAYTONE MASK AND APPARATUS DOING THE SAME
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 7-5, NAKA-OCHIAI, 2-CHOME, SHINJUKU-KU |
| TOKYO, JAPAN |
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| SUGHRUE MION, PLLC |
| DARRYL MEXIC |
| 2100 PENNSYLVANIA AVENUE, N.W. |
| SUITE 800 |
| WASHINGTON, DC 20037-3213 |
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