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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
10227062
Filing Dt:
08/22/2002
Publication #:
Pub Dt:
06/19/2003
Inventors:
Hyuk Kwon, Jeong-Ho Bang, Hyun-Seop Shim, Yong-Woon Kim, Young-Gu Shin, Hyoung-Young Lee
Title:
Parallel testing system for semiconductor memory devices
Assignment: 1
Reel/Frame:
013236/0254Recorded: 08/22/2002Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
08/22/2002
Exec Dt:
08/22/2002
Exec Dt:
08/22/2002
Exec Dt:
08/22/2002
Exec Dt:
08/22/2002
Exec Dt:
08/22/2002
Assignee:
SAN 16, BANWOI, RI, TAEAN-EUB, HWASUNG-CITY
GYEONGGI-DO, KOREA, REPUBLIC OF
Correspondent:
MARGER JOHNSON & MCCOLLOM, P.C.
ALAN T. MCCOLLOM
1030 SW MORRISON ST.
PORTLAND, OR 97205

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