Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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10227062
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Filing Dt:
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08/22/2002
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Publication #:
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Pub Dt:
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06/19/2003
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Inventors:
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Hyuk Kwon, Jeong-Ho Bang, Hyun-Seop Shim, Yong-Woon Kim, Young-Gu Shin, Hyoung-Young Lee
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Title:
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Parallel testing system for semiconductor memory devices
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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SAN 16, BANWOI, RI, TAEAN-EUB, HWASUNG-CITY |
GYEONGGI-DO, KOREA, REPUBLIC OF |
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MARGER JOHNSON & MCCOLLOM, P.C. |
ALAN T. MCCOLLOM |
1030 SW MORRISON ST. |
PORTLAND, OR 97205 |
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