Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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04/03/2007
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Application #:
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10411283
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Filing Dt:
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04/11/2003
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Publication #:
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Pub Dt:
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10/30/2003
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Inventors:
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Ryuji Kohno, Tetsuo Kumazawa, Yasuhiro Motoyama, Makoto Kitano, Akihiko Ariga, Yuji Wada et al
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Title:
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SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF INCLUDING A PROBE TEST STEP AND A BURN-IN TEST STEP
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 6-2, OTEMACHI 2-CHOME |
| CHIYODA-KU, TOKYO, JAPAN |
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| ANTONELLI TERRY STOUT, ET AL. |
| 1300 NORTH 17TH STREET |
| SUITE 1800 |
| ARLINGTON, VA 22209 |
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Assignment:
2
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MERGER (SEE DOCUMENT FOR DETAILS).
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| 1753 SHIMONUMABE |
| NAKAHARA-KU, KAWASAKI |
| KANAGAWA, JAPAN |
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| ANTONELLI, TERRY, STOUT & KRAUS, LLP |
| 1300 NORTH 17TH STREET - SUITE 1800 |
| ARLINGTON, VA 22209 |
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