Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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09/07/2004
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Application #:
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10448661
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Filing Dt:
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05/30/2003
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Publication #:
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Pub Dt:
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01/29/2004
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Inventors:
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Ming-Cheng Chang, Tie-Jiang Wu, Jeng-Ping Lin, Tse-Main Kuo, Hsu-Cheng Fan
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Title:
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TEST KEY FOR DETECTING OVERLAP BETWEEN ACTIVE AREA AND DEEP TRENCH CAPACITOR OF A DRAM AND DETECTION METHOD THEREOF
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| HWA-YA TECHNOLOGY PARK 669 |
| FUHSING 3 RD., KUEISHAN |
| TAOYUAN, TAIWAN |
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| QUINTERO LAW OFFICE |
| NELSON A. QUINTERO |
| 1617 BROADWAY, 3RD FLOOR |
| SANTA MONICA, CA 90404 |
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