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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
10759267
Filing Dt:
01/20/2004
Publication #:
Pub Dt:
07/29/2004
Inventors:
Geum-Jin Yun, Jin-Sung Jung, Seong-Goo Kang, Jeong-Ho Bang, Byoung-Jun Min
Title:
Integrated monitoring burn-in test method for multi-chip package
Assignment: 1
Reel/Frame:
014961/0111Recorded: 01/20/2004Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
01/09/2004
Exec Dt:
01/09/2004
Exec Dt:
01/14/2004
Exec Dt:
01/09/2004
Exec Dt:
01/09/2004
Assignee:
416 MAETAN-DONG, YEONGTONG-GU, SUWON-CITY
GYEONGGI-DO, KOREA, REPUBLIC OF
Correspondent:
HARNESS, DICKEY & PIERCE, P.L.C.
P.O. BOX 8910
RESTON, VA 20195

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