Patent Assignment Abstract of Title
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Total Assignments:
4
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Patent #:
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Issue Dt:
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06/12/2007
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Application #:
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10739275
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Filing Dt:
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12/19/2003
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Publication #:
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Pub Dt:
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09/23/2004
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Inventors:
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Tadahito Fujisawa, Soichi Inoue, Makoto Kobayashi, Masashi Ichikawa, Tsuneyuki Hagiwara et al
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Title:
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WAFER FLATNESS EVALUATION METHOD, WAFER FLATNESS EVALUATION APPARATUS CARRYING OUT THE EVALUATION METHOD, WAFER MANUFACTURING METHOD USING THE EVALUATION METHOD, WAFER QUALITY ASSURANCE METHOD USING THE EVALUATION METHOD, SEMICONDUCTOR DEVICE MANUFACTURING METHOD U
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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1-1, SHIBAURA 1-CHOME, MINATO-KU |
TOKYO, JAPAN 105-8001 |
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4-2, MARUNOUCHI 1-CHOME, CHIYODA-KU |
TOKYO 100-8331, JAPAN |
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2-3, MARUNOUCHI 3-CHOME, CHIYODA-KU |
TOKYO, JAPAN 100-8331 |
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FINNEGAN, HENDERSON, FARABOW, ET AL. |
ERNEST F. CHAPMAN |
1300 I STREET, N.W. |
WASHINGTON, D.C. 20005-3315 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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1-1, SHIBAURA 1-CHOME |
MINATO-KU, TOKYO, JAPAN 105-0023 |
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JOHN M MULCAHY |
901 NEW YORK AVE, NW |
WASHINGTON, DC 20001 |
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Assignment:
3
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MERGER AND CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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Newly Merged Entity's New Name:
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1-1, SHIBAURA 1-CHOME |
MINATO-KU, TOKYO, JAPAN |
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OBLON, ET AL. |
1940 DUKE STREET |
ALEXANDRIA, VA 22314 |
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Assignment:
4
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CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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1-21, SHIBAURA 3-CHOME |
MINATO-KU, TOKYO, JAPAN |
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OBLON, ET AL. |
1940 DUKE STREET |
ALEXANDRIA, VA 22314 |
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