Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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06/21/2005
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Application #:
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10665191
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Filing Dt:
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09/16/2003
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Publication #:
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Pub Dt:
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12/09/2004
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Inventors:
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Hong Hocheng, Chin Chung Nien
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Title:
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IN-SITU MONITORING METHOD AND SYSTEM FOR MOLD DEFORMATION IN NANOIMPRINT
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 101 SECTION 2, KUANG-FU ROAD |
| HSINCHU, TAIWAN 30013 |
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| LIN & ASSOCIATES INTELLECTUAL PROPERTY, |
| P.O. BOX 2339 |
| SARATOGA, CA 95070-0339 |
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