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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
12/18/2007
Application #:
10766038
Filing Dt:
01/29/2004
Publication #:
Pub Dt:
12/30/2004
Inventors:
Haruo Nishida, Takuya Ishida
Title:
AN INTEGRATED TEST CIRCUIT, A TEST CIRCUIT, AND A TEST METHOD FOR PERFORMING TRANSMISSION AND RECEPTION PROCESSING TO AND FROM A FIRST AND A SECOND MACRO BLOCK AT A FIRST FREQUENCY
Assignment: 1
Reel/Frame:
015062/0045Recorded: 08/13/2004Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
03/03/2004
Exec Dt:
03/03/2004
Assignee:
4-1, NISHI-SHINJUKU 2-CHOME, SHINJUKU-KU,
TOKYO,, JAPAN
Correspondent:
OLIFF & BERRIDGE, PLC
JAMES A. OLIFF
P.O. BOX 19928
ALEXANDRIA, VA 22320
Assignment: 2
Reel/Frame:
050265/0622Recorded: 09/04/2019Pages: 12
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
04/17/2019
Assignee:
BRACKEN ROAD, SANDYFORD
FIRST FLOOR, BLACKTHORN EXCHANGE
DUBLIN, IRELAND D18 P3Y9
Correspondent:
LONGITUDE LICENSING LTD
BRACKEN ROAD, SANDYFORD
FIRST FLOOR, BLACKTHORN EXCHANGE
DUBLIN, D18 P3Y9 IRELAND

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