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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
10863327
Filing Dt:
06/09/2004
Publication #:
Pub Dt:
01/06/2005
Inventors:
Shouzou Hirano, Kenji Shimazaki, Hiroyuki Tsujikawa
Title:
Substrate noise analyzing method for semiconductor integrated circuit, semiconductor integrated circuit, and substrate noise analyzing device for semiconductor integrated circuit
Assignment: 1
Reel/Frame:
015448/0750Recorded: 06/09/2004Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
06/04/2004
Exec Dt:
06/04/2004
Exec Dt:
06/04/2004
Assignee:
1006, OAZA KADOMA
KADOMA-SHI, OSAKA, JAPAN 571-8501
Correspondent:
MCDERMOTT WILL & EMERY LLP
MICHAEL E. FOGARTY
600 13TH STREET, NW
WASHINGTON, DC 2005-3096

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