Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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05/04/2010
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Application #:
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10893511
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Filing Dt:
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07/16/2004
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Publication #:
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Pub Dt:
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01/27/2005
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Inventors:
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David M. Gibson, Walter M. Gibson, Huapeng Huang, Jodi Lynn Reeves
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Title:
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METHOD AND SYSTEM FOR X-RAY DIFFRACTION MEASUREMENTS USING AN ALIGNED SOURCE AND DETECTOR ROTATING AROUND A SAMPLE SURFACE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 15 TECH VALLEY DRIVE |
| EAST GREENBUSCH, NEW YORK 12061 |
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| 450 DUANE AVENUE |
| SCHENECTADY, NEW YORK 12304 |
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| HESLIN ROTHENBERG FARLEY & MESITI, P.C. |
| KEVIN P. RADIGAN, ESQ. |
| 5 COLUMBIA CIRCLE |
| ALBANY, NY 12203 |
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