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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
01/29/2008
Application #:
10707205
Filing Dt:
11/26/2003
Publication #:
Pub Dt:
06/23/2005
Inventors:
Lawrence Pileggi, Chik Patrick Yue, R. Shawn Blanton, Thomas Vogels
Title:
SYSTEM AND METHOD TO TEST INTEGRATED CIRCUITS ON A WAFER
Assignment: 1
Reel/Frame:
014161/0488Recorded: 12/01/2003Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
11/20/2003
Exec Dt:
11/24/2003
Exec Dt:
11/20/2003
Exec Dt:
11/20/2003
Assignee:
5000 FORBES AVENUE
PITTSBURGH, PENNSYLVANIA 15213
Correspondent:
MOORE & VAN ALLEN, PLLC
2200 W MAIN STREET
SUITE 800
DURHAM, NC 27705

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