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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
07/15/2008
Application #:
11009096
Filing Dt:
12/10/2004
Publication #:
Pub Dt:
08/04/2005
Inventors:
David Hellin, Ivo Teerlinck, Jan Van Steenbergen
Title:
IMPURITY MEASURING METHOD FOR GE SUBSTRATES
Assignment: 1
Reel/Frame:
015808/0092Recorded: 03/22/2005Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
01/07/2005
Exec Dt:
01/14/2005
Exec Dt:
01/07/2005
Assignee:
KAPELDREEF 75
3001 LEUVEN, BELGIUM
Correspondent:
KNOBBE MARTENS OLSEN & BEAR LLP
2040 MAIN STREET
FOURTEENTH FLOOR
IRVINE, CA 92614
Assignment: 2
Reel/Frame:
016636/0247Recorded: 10/12/2005Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
10/12/2005
Assignee:
BROEKSTRAAT 31
1000 BRUSSEL, BELGIUM
Correspondent:
KNOBBE MARTENS OLSON & BEAR LLP
2040 MAIN STREET
FOURTEENTH FLOOR
IRVINE, CA 92614

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