Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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03/23/2010
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Application #:
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10851113
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Filing Dt:
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05/24/2004
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Publication #:
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Pub Dt:
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09/29/2005
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Inventors:
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Chin-Chung Nien, Ta-Chuan Liu, Hong Hocheng
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Title:
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CAPACITIVE MEASUREMENT METHOD AND SYSTEM FOR NANOIMPRINT PROCESS MONITORING
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NO 195, SEC. 4, CHUNG HSING RD. CHUTUNG |
| HSINCHU, TAIWAN R.O.C. |
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| TROXELL LAW OFFICE PLLC |
| BRUCE H. TROXELL |
| 5205 LESS BURG PIKE |
| SUITE 1404 |
| FALLS CHURCH, VIRGINIA 22041-3401 |
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