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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
04/11/2006
Application #:
10813407
Filing Dt:
03/29/2004
Publication #:
Pub Dt:
09/29/2005
Inventors:
Jiping Li, Peter G. Borden, Edgar B. Genio
Title:
HIGH THROUGHPUT MEASUREMENT OF VIA DEFECTS IN INTERCONNECTS
Assignment: 1
Reel/Frame:
015178/0106Recorded: 03/29/2004Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
03/26/2004
Exec Dt:
03/26/2004
Exec Dt:
03/26/2004
Assignee:
3050 BOWERS AVENUE
SANTA CLARA, CALIFORNIA 95054
Correspondent:
APPLIED MATERIALS, INC.
LEGAL AFFAIRS DEPT. - MS 2061
P.O. BOX 450A
SANTA CLARA, CA 95052

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