skip navigationU S P T O SealUnited States Patent and Trademark Office AOTW logo
Home|Site Index|Search|Guides|Contacts|eBusiness|eBiz alerts|News|Help
Assignments on the Web > Patent Query
Patent Assignment Abstract of Title
NOTE:Results display only for issued patents and published applications. For pending or abandoned applications please consult USPTO staff.

Total Assignments: 2
Patent #:
7399964
Issue Dt:
07/15/2008
Application #:
11119934
Filing Dt:
05/03/2005
Publication #:
20050247860
Pub Dt:
11/10/2005
Inventors:
Chie Shishido, Ryo Nakagaki, Mayuka Oosaki, Hiroki Kawada
Title:
ELECTRON MICROSCOPE, MEASURING METHOD USING THE SAME, ELECTRON MICROSCOPE SYSTEM, AND METHOD FOR CONTROLLING THE SYSTEM
Assignment: 1
Reel/Frame:
016723/0353Recorded: 06/27/2005Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
SHISHIDO, CHIE
Exec Dt:
05/27/2005
NAKAGAKI, RYO
Exec Dt:
05/20/2005
OOSAKI, MAYUKA
Exec Dt:
05/26/2005
KAWADA, HIROKI
Exec Dt:
05/24/2005
Assignee:
HITACHI-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME
MINATO-KU, TOKYO, JAPAN
Correspondent:
ANTONELLI TERRY STOUT & KRAUS, LLP
1300 NORTH 17TH STREET - SUITE 1800
ARLINGTON, VA 22209
Assignment: 2
Reel/Frame:
017324/0575Recorded: 11/23/2005Pages: 3
Conveyance:
CORRECTION TO THE ASSIGNEE
Assignors:
SHISHIDO, CHIE
Exec Dt:
05/27/2005
NAKAGAKI, RYO
Exec Dt:
05/20/2005
OOSAKI, MAYUKA
Exec Dt:
05/26/2005
KAWADA, HIROKI
Exec Dt:
05/24/2005
Assignee:
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME
MINATO-KU, TOKYO, JAPAN
Correspondent:
ANTONELLI, TERRY, STOUT & KRAUS, LLP
1300 NORTH 17TH STREET - SUITE 1800
ARLINGTON, VA 22209

Search Results as of: 04/30/2024 03:07 PM
If you have any comments or questions concerning the data displayed, contact PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified: August 25, 2017 v.2.6
| .HOME | INDEX| SEARCH | eBUSINESS | CONTACT US | PRIVACY STATEMENT