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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
11177227
Filing Dt:
07/08/2005
Publication #:
Pub Dt:
12/22/2005
Inventors:
Wenbing Yun, Yuxin Wang, Michael Feser, Kenneth W. Nill
Title:
BACK-END-OF-LINE METALLIZATION INSPECTION AND METROLOGY MICROSCOPY SYSTEM AND METHOD USING X-RAY FLUORESCENCE
Assignment: 1
Reel/Frame:
016759/0682Recorded: 09/08/2005Pages: 5
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
08/31/2005
Exec Dt:
08/09/2005
Exec Dt:
08/31/2005
Exec Dt:
08/31/2005
Assignee:
4075A SPRIG DRIVE
CONCORD, CALIFORNIA 94520
Correspondent:
J. GRANT HOUSTON
HOUSTON ELISEEVA LLP
4 MILITIA DRIVE
SUITE 4
LEXINGTON, MA 02421

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