Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11177227
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Filing Dt:
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07/08/2005
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Publication #:
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Pub Dt:
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12/22/2005
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Inventors:
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Wenbing Yun, Yuxin Wang, Michael Feser, Kenneth W. Nill
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Title:
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BACK-END-OF-LINE METALLIZATION INSPECTION AND METROLOGY MICROSCOPY SYSTEM AND METHOD USING X-RAY FLUORESCENCE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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4075A SPRIG DRIVE |
CONCORD, CALIFORNIA 94520 |
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J. GRANT HOUSTON |
HOUSTON ELISEEVA LLP |
4 MILITIA DRIVE |
SUITE 4 |
LEXINGTON, MA 02421 |
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