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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
11226815
Filing Dt:
09/13/2005
Publication #:
Pub Dt:
03/16/2006
Inventor:
Yoshihiro Shiode
Title:
Measuring apparatus, test reticle, exposure apparatus and device manufacturing method
Assignment: 1
Reel/Frame:
016994/0618Recorded: 09/13/2005Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
09/05/2005
Assignee:
3-30-2, SHIMOMARUKO, OHTA-KU
TOKYO, JAPAN
Correspondent:
MORGAN & FINNEGAN, L.L.P.
3 WORLD FINANCIAL CENTER
NEW YORK, NY 10281-2101

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