Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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10974715
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Filing Dt:
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10/28/2004
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Publication #:
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Pub Dt:
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03/23/2006
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Inventor:
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Yung-Yao Lee
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Title:
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Methods and systems for determining lithography overlay offsets
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 3F, NO. 19, LI HSIN RD., |
| SCIENCE-BASED INDUSTRIAL PARK |
| HSINCHU TAIWAN, CHINA |
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| JOE MCKINNEY MUNCY |
| BIRCH, STEWART, KOLASCH & BIRCH, LLP |
| 8110 GATEHOUSE RD |
| SUITE 100 EAST, P.O. BOX 747 |
| FALLS CHURCH, VA 22040-0747 |
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