Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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10/03/2006
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Application #:
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11302674
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Filing Dt:
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12/14/2005
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Publication #:
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Pub Dt:
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05/04/2006
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Inventors:
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Lena Nicolaides, Jeffrey T. Fanton, Alex Salnik, Jon Opsal
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Title:
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MODULATED REFLECTANCE MEASUREMENT SYSTEM WITH MULTIPLE WAVELENGTHS
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Assignment:
1
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MERGER (SEE DOCUMENT FOR DETAILS).
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| ONE TECHNOLOGY DRIVE |
| MILPITAS, CALIFORNIA 95035 |
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| MICHAEL A. STALLMAN |
| 425 MARKET STREET |
| SAN FRANCISCO, CA 94105 |
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