Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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01/27/2009
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Application #:
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11270433
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Filing Dt:
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11/09/2005
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Publication #:
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Pub Dt:
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05/11/2006
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Inventors:
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Seung Woo Kim, Young Sik Ghim
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Title:
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APPARATUS AND METHOD FOR MEASURING THICKNESS AND PROFILE OF TRANSPARENT THIN FILM USING WHITE-LIGHT INTERFEROMETER
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 373-1, GUSUNG-DONG YUSEONG-GU |
| DAEJEON CITY, KOREA, REPUBLIC OF 305-701 |
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| STUART H. MAYER |
| MAYER FORTKORT & WILLIAMS, PC |
| 251 NORTH AVENUE WEST, 2ND FLOOR |
| WESTFIELD NEW JERSEY 07090 |
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