Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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06/24/2008
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Application #:
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11307515
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Filing Dt:
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02/10/2006
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Publication #:
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Pub Dt:
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06/08/2006
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Inventor:
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Keun Woo Lee
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Title:
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STRUCTURE AND METHOD FOR MEASURING THE CHANNEL BOOSTING VOLTAGE OF NAND FLASH MEMORY AT A NODE BETWEEN DRAIN/SOURCE SELECT TRANSISTOR AND ADJACENT FLASH MEMORY CELL
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| SAN 136-1, AMI-RI, BUBAL-UEP |
| KYUNGKI-DO |
| ICHON-SHI, KOREA, REPUBLIC OF |
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| MARSHALL GERSTEIN & BORUN LLP |
| 233 SOUTH WACKER DRIVE |
| SUITE 6300 |
| CHICAGO, IL 60606 |
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