Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11103352
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Filing Dt:
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04/11/2005
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Publication #:
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Pub Dt:
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07/06/2006
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Inventors:
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Makoto Yamazaki, Hidenobu Matsumura
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Title:
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Semiconductor device, test apparatus and measurement method therefor
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-32-1 ASAHI-CHO NERIMA-KU |
| TOKYO 179-0071, JAPAN |
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| JONATHAN P. OSHA |
| OSHA - LIANG LLP |
| 1221 MCKINNEY ST., SUITE 2800 |
| HOUSTON, TX 77010 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-32-1, ASAHI-CHO, NERIMA-KU |
| TOKYO, JAPAN 179-0071 |
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| OSHA LIANG LLP |
| 1221 MCKINNEY, SUITE 2800 |
| HOUSTON, TX 77010 |
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