Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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10/16/2007
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Application #:
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11388316
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Filing Dt:
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03/24/2006
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Publication #:
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Pub Dt:
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08/17/2006
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Inventors:
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Thomas C. Bristow, Shu W. Wang, John E. Stephan
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Title:
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METHOD AND APPARATUS FOR MEASURING WAFER THICKNESS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 3 TOWNLINE CIRCLE |
| ROCHESTER, NEW YORK 14623 |
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| NEAL L. SLIFKIN |
| HARRIS BEACH PLLC |
| 99 GARNSEY ROAD |
| PITTSFORD, NY 14534 |
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