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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
11/11/2008
Application #:
11349974
Filing Dt:
02/09/2006
Publication #:
Pub Dt:
08/24/2006
Inventors:
Hidetoshi Nishiyama, Muneyuki Fukuda, Noritsugu Takahashi, Mitsugu Sato, Atsuko Fukada et al
Title:
INSPECTION METHOD AND INSPECTION APPARATUS USING CHARGED PARTICLE BEAM
Assignment: 1
Reel/Frame:
017557/0462Recorded: 02/09/2006Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
01/14/2006
Exec Dt:
01/12/2006
Exec Dt:
12/23/2005
Exec Dt:
12/23/2005
Exec Dt:
12/22/2005
Exec Dt:
12/23/2005
Assignee:
24-14, NISHISHINBASHI 1-CHOME
MINATO-KU, TOKYO, JAPAN
Correspondent:
ANTONELLI, TERRY, STOUT & KRAUS, LLP
1300 NORTH 17TH STREET
SUITE 1800
ARLINGTON, VA 22209

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