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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
11495515
Filing Dt:
07/31/2006
Publication #:
Pub Dt:
02/01/2007
Inventors:
Cheng-Yung Teng, Yi-Chang Hsu, Li-Jieu Hsu
Title:
Test system and single-chip tester capable of testing a plurality of chips simultaneously
Assignment: 1
Reel/Frame:
018146/0255Recorded: 07/31/2006Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
07/21/2006
Exec Dt:
07/21/2006
Exec Dt:
07/21/2006
Assignee:
2F, NO. 233-1, BAO CHIAO RD.
HSIN TIEN, TAIPEI COUNTY 231, TAIWAN R.O.C.
Correspondent:
JOE MCKINNEY MUNCY
BIRCH, STEWART, KOLASCH & BIRCH, LLP
8110 GATEHOUSE ROAD
SUITE 100 EAST, P.O. BOX 747
FALLS CHURCH, VA 22040-0747

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