Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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01/13/2009
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Application #:
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11498928
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Filing Dt:
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08/03/2006
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Publication #:
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Pub Dt:
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02/15/2007
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Inventor:
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Kye-hyun Kyung
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Title:
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SEMICONDUCTOR INTEGRATED CIRCUIT WHICH CAN BE BURN-IN-TESTED EVEN WHEN PACKAGED AND METHOD OF BURN-IN-TESTING SEMICONDUCTOR INTEGRATED CIRCUIT EVEN WHEN THE SEMICONDUCTOR INTEGRATED CIRCUIT IS PACKAGED
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 416, MAETAN-DONG, YEONGTONG-GU |
| SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF |
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| MILLS & ONELLO LLP |
| ELEVEN BEACON STREET |
| SUITE 605 |
| BOSTON, MA 02108 |
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