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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
02/22/2011
Application #:
11465893
Filing Dt:
08/21/2006
Publication #:
Pub Dt:
03/29/2007
Inventors:
Jeffrey A. Rzepiela, Yiping Feng, Shiyou Pei, Alexander Kagan, Jianou Shi et al
Title:
SYSTEMS AND METHODS FOR CONTROLLING DEPOSITION OF A CHARGE ON A WAFER FOR MEASUREMENT OF ONE OR MORE ELECTRICAL PROPERTIES OF THE WAFER
Assignment: 1
Reel/Frame:
018623/0860Recorded: 12/13/2006Pages: 18
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
11/20/2006
Exec Dt:
11/14/2006
Exec Dt:
10/26/2006
Exec Dt:
10/26/2006
Exec Dt:
11/01/2006
Exec Dt:
12/01/2006
Assignee:
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
BAKER & MCKENZIE LLP
1114 AVENUE OF THE AMERICAS
NEW YORK, NY 10036

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