Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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Issue Dt:
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11/04/2008
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Application #:
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11614127
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Filing Dt:
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12/21/2006
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Publication #:
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Pub Dt:
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06/28/2007
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Inventors:
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Yasuhiro TOMITA, Manabu KOMIYA, Hitoshi SUWA, Toshiki MORI
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Title:
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SEMICONDUCTOR LEAKAGE CURRENT DETECTOR AND LEAKAGE CURRENT MEASUREMENT METHOD, SEMICONDUCTOR LEAKAGE CURRENT DETECTOR WITH VOLTAGE TRIMMING FUNCTION AND REFERENCE VOLTAGE TRIMMING METHOD, AND SEMICONDUCTOR INTERGRATED CIRCUIT THEREOF
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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1006 OAZA KADOMA, KADOMA-SHI |
OSAKA, JAPAN 571-8501 |
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KENJI KAMATA |
1130 CONNECTICUT AVE., N.W., SUITE 1100 |
PANASONIC PATENT CENTER |
WASHINGTON, DC 20036 |
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Assignment:
2
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CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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1006, OAZA KADOMA, KADOMA-SHI |
OSAKA, JAPAN 571-8501 |
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PANASONIC CORPORATION |
2-1-61, SHIROMI, CHUO-KU |
7F OBP PANASONIC TOWER |
OSAKA, 540-6207 JAPAN |
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Assignment:
3
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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2711 CENTERVILLE ROAD |
SUITE 400 |
WILMINGTON, DELAWARE 19808 |
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BRANDON C. STALLMAN, ESQ. |
CHRISTENSEN O'CONNOR JOHNSON KINDNESS |
1201 THIRD AVENUE, SUITE 3600 |
SEATTLE, WA 98101 |
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