Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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04/21/2009
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Application #:
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11656953
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Filing Dt:
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01/24/2007
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Publication #:
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Pub Dt:
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08/16/2007
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Inventors:
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Hideaki Abe, Hiroshi Motoki
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Title:
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CHARGED PARTICLE BEAM APPARATUS, CHARGED PARTICLE BEAM FOCUSING METHOD, MICROSTRUCTURE MEASURING METHOD, MICROSTRUCTURE INSPECTING METHOD, SEMICONDUCTOR DEVICE MANUFACTURING METHOD, AND PROGRAM
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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1-1, SHIBAURA 1-CHOME, MINATO-KU |
TOKYO, JAPAN |
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FINNEGAN, HENDERSON, FARABOW, |
GARRETT & DUNNER, LLP |
901 NEW YORK AVENUE, NW |
WASHINGTON, DC 20001-4413 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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1-1, SHIBAURA 1-CHOME |
MINATO-KU |
TOKYO, JAPAN 105-0023 |
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OBLON, ET AL. |
1940 DUKE STREET |
ALEXANDRIA, VA 22314 |
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