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Patent Assignment Abstract of Title
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Total Assignments: 3
Patent #:
NONE
Issue Dt:
Application #:
11785624
Filing Dt:
04/19/2007
Publication #:
Pub Dt:
08/23/2007
Inventor:
Masaaki Tanimura
Title:
Semiconductor integrated circuit and test system for testing the same
Assignment: 1
Reel/Frame:
031610/0851Recorded: 11/15/2013Pages: 15
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
09/03/2013
Assignee:
5750 HELLYER AVENUE
SAN JOSE, CALIFORNIA 95138
Correspondent:
MARIBETH CALLANAN
125 MIDDLESEX TURNPIKE
BEDFORD, MA 01730
Assignment: 2
Reel/Frame:
031816/0886Recorded: 12/19/2013Pages: 22
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
09/27/2013
Assignee:
125 MIDDLESEX TURNPIKE
MARIBETH CALLANAN
BEDFORD, MASSACHUSETTS 01730
Correspondent:
GSI GROUP, INC.
125 MIDDLESEX TURNPIKE
MARIBETH CALLANAN
BEDFORD, MA 01730
Assignment: 3
Reel/Frame:
032095/0671Recorded: 01/29/2014Pages: 26
Conveyance:
CORRECTIVE ASSIGNMENT TO CORRECT THE NAME OF ASSIGNOR PREVIOUSLY RECORDED ON REEL 031816 FRAME 0886. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT.
Assignor:
Exec Dt:
09/27/2013
Assignee:
125 MIDDLESEX TURNPIKE
MARIBETH CALLANAN
BEDFORD, MASSACHUSETTS 01730
Correspondent:
GSI GROUP, INC.
125 MIDDLESEX TURNPIKE
MARIBETH CALLANAN
BEDFORD, MA 01730

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