Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11785624
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Filing Dt:
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04/19/2007
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Publication #:
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Pub Dt:
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08/23/2007
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Inventor:
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Masaaki Tanimura
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Title:
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Semiconductor integrated circuit and test system for testing the same
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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5750 HELLYER AVENUE |
SAN JOSE, CALIFORNIA 95138 |
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MARIBETH CALLANAN |
125 MIDDLESEX TURNPIKE |
BEDFORD, MA 01730 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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125 MIDDLESEX TURNPIKE |
MARIBETH CALLANAN |
BEDFORD, MASSACHUSETTS 01730 |
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GSI GROUP, INC. |
125 MIDDLESEX TURNPIKE |
MARIBETH CALLANAN |
BEDFORD, MA 01730 |
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Assignment:
3
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CORRECTIVE ASSIGNMENT TO CORRECT THE NAME OF ASSIGNOR PREVIOUSLY RECORDED ON REEL 031816 FRAME 0886. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT.
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125 MIDDLESEX TURNPIKE |
MARIBETH CALLANAN |
BEDFORD, MASSACHUSETTS 01730 |
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GSI GROUP, INC. |
125 MIDDLESEX TURNPIKE |
MARIBETH CALLANAN |
BEDFORD, MA 01730 |
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