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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
11702599
Filing Dt:
02/06/2007
Publication #:
Pub Dt:
08/30/2007
Inventors:
Byung-Sug Lee, Mi-Sung Lee, Yu-Sin Yang, Yun-Jung Jee, Chung-Sam Jun
Title:
Method of measuring critical dimension
Assignment: 1
Reel/Frame:
018965/0951Recorded: 02/06/2007Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
02/06/2007
Exec Dt:
02/06/2007
Exec Dt:
02/06/2007
Exec Dt:
02/06/2007
Exec Dt:
02/06/2007
Assignee:
416, MAETAN-DONG, YEONGTONG-GU, SUWON-SI
GYEONGGI-DO, KOREA, REPUBLIC OF
Correspondent:
STEPHEN R. WHITT
VOLENTINE & WHITT, PLLC
ONE FREEDOM SQUARE
11951 FREEDOM DRIVE, SUITE 1260
RESTON, VA 20190

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