Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11702599
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Filing Dt:
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02/06/2007
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Publication #:
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Pub Dt:
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08/30/2007
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Inventors:
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Byung-Sug Lee, Mi-Sung Lee, Yu-Sin Yang, Yun-Jung Jee, Chung-Sam Jun
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Title:
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Method of measuring critical dimension
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 416, MAETAN-DONG, YEONGTONG-GU, SUWON-SI |
| GYEONGGI-DO, KOREA, REPUBLIC OF |
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| STEPHEN R. WHITT |
| VOLENTINE & WHITT, PLLC |
| ONE FREEDOM SQUARE |
| 11951 FREEDOM DRIVE, SUITE 1260 |
| RESTON, VA 20190 |
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