Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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04/21/2009
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Application #:
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11569249
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Filing Dt:
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11/17/2006
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Publication #:
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Pub Dt:
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10/04/2007
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Inventors:
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Fumi Nabeshima, Kazuya Togashi
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Title:
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APPARATUS AND METHOD FOR INSPECTING SEMICONDUCTOR WAFER
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 25-1, SHINOMIYA 3-CHOME |
| KIRATSUKA-SHI, KANAGAWA, JAPAN 254-0014 |
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| JOSEPH P. FARRAR |
| C/O ORION CONSULTING, LTD. |
| KANDA CENTER BLDG., 5TH FLOOR |
| 2-3-2 KAJICHO, CHIYODA-KU |
| TOKYO, JAPAN 101-0044 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 25-1, SHINOMIYA 3-CHOME |
| HIRATSUKA-SHI, KANAGAWA, JAPAN 254-0014 |
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| JOSEPH P. FARRAR |
| C/O ORION CONSULTING, LTD. |
| KANDA CENTER BLDG., 5TH FLOOR |
| 2-3-2 KEJICHO, CHIYODA-KU |
| TOKYO, JAPAN 101-0044 |
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