Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11692367
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Filing Dt:
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03/28/2007
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Publication #:
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Pub Dt:
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11/15/2007
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Inventors:
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Kedarnath Balakrishnan, Seongmoon Wang, Wenlong Wei, Srimat T. Chakradhar
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Title:
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Method and Apparatus for Testing an Integrated Circuit
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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4 INDEPENDENCE WAY |
SUITE 200 |
PRINCETON, NEW JERSEY 08540 |
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JOSEPH J. KOLODKA |
NEC LABORATORIES AMERICA, INC. |
4 INDEPENDENCE WAY, SUITE 200 |
PRINCETON, NJ 08540 |
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