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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
04/08/2008
Application #:
11426723
Filing Dt:
06/27/2006
Publication #:
Pub Dt:
12/27/2007
Inventors:
Jianhong Zhu, David D. Wu, Mark W. Michael
Title:
TEST STRUCTURE FOR MEASURING ELECTRICAL AND DIMENSIONAL CHARACTERISTICS
Assignment: 1
Reel/Frame:
017852/0459Recorded: 06/27/2006Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
06/13/2006
Exec Dt:
06/19/2006
Exec Dt:
06/19/2006
Assignee:
5204 E. BEN WHITE BLVD.
AUSTIN,, TEXAS 78741
Correspondent:
SCOTT F. DIRING
WILLIAMS, MORGAN & AMERSON
10333 RICHMOND AVE, SUITE 1100
HOUSTON, TX 77042

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