Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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06/08/2010
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Application #:
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11819397
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Filing Dt:
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06/27/2007
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Publication #:
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Pub Dt:
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01/03/2008
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Inventor:
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Katsuhiko Harazaki
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Title:
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CORRECTION METHOD AND CORRECTION SYSTEM FOR DESIGN DATA OR MASK DATA, VALIDATION METHOD AND VALIDATION SYSTEM FOR DESIGN DATA OR MASK DATA, YIELD ESTIMATION METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT, METHOD FOR IMPROVING DESIGN RULE, MASK PRODUCTION METHOD, AND SEMICONDUCTOR INTEGRATED CIRCUIT PRODUCTION METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 22-22 NAGAIKE-CHO ABENO-KU |
| OSAKA-SHI, OSAKA, JAPAN 545-8522 |
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| H. WARREN BURNAM, JR. |
| NIXON & VANDERHYE P.C. |
| 901 NORTH GLEBE ROAD |
| 11TH FLOOR |
| ARLINGTON, VA 22203 |
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