Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11460209
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Filing Dt:
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07/26/2006
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Publication #:
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Pub Dt:
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01/31/2008
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Inventors:
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Ming-Hsiu Lee, Chao-I Wu, Ming-Chang Kuo
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Title:
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A TEST STRUCTURE AND METHOD FOR DETECTING CHARGE EFFECTS DURING SEMICONDUCTOR PROCESSING
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NO. 16, LI-HSIN ROAD |
| SCIENCE-BASED INDUSTRIAL PARK |
| HSINCHU, TAIWAN |
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| NOEL C. GILLESPIE |
| 2001 ROSS AVENUE, SUITE 2300 |
| BAKER & MCKENZIE |
| DALLAS, TX 75201 |
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