Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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02/02/2010
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Application #:
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11583830
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Filing Dt:
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10/20/2006
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Publication #:
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Pub Dt:
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03/27/2008
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Inventors:
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Sei Umisedo, Nariaki Hamamoto, Tadashi Ikejiri, Kohei Tanaka
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Title:
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ION BEAM MEASURING METHOD AND ION IMPLANTING APPARATUS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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575, KUZE TONOSHIRO-CHO |
MINAMI-KU |
KYOTO-SHI, KYOTO 601-8205, JAPAN |
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ERNEST F. CHAPMAN |
FINNEGAN, HENDERSON, FARABOW, GARRETT |
& DUNNER, L.L.P. |
901 NEW YORK AVENUE, NW |
WASHINGTON, D.C. 200001-4413 |
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