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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
7587700
Issue Dt:
09/08/2009
Application #:
10817104
Filing Dt:
04/01/2004
Publication #:
20080092088
Pub Dt:
04/17/2008
Inventors:
Youval Nehmadi, Zamir Abraham, Gil Sod-Moriah, Yair Eran, Chen Ofek, Yaron Cohen et al
Title:
PROCESS MONITORING SYSTEM AND METHOD FOR PROCESSING A LARGE NUMBER OF SUB-MICRON MEASUREMENT TARGETS
Assignment: 1
Reel/Frame:
017808/0404Recorded: 06/19/2006Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
NEHMADI, YOUVAL
Exec Dt:
06/13/2006
ABRAHAM, ZAMIR
Exec Dt:
06/13/2006
SOD-MORIAH, GIL
Exec Dt:
06/14/2006
ERAN, YAIR
Exec Dt:
06/12/2006
OFEK, CHEN
Exec Dt:
06/12/2006
COHEN, YARON
Exec Dt:
06/13/2006
BEN-PORATH, ARIEL
Exec Dt:
06/12/2006
Assignee:
APPLIED MATERIALS ISRAEL, LTD.
9 OPPENHEIMER ST.
REHOVOT, ISRAEL 76236
Correspondent:
PATENT COUNSEL, APPLIED MATERIALS, INC.
P.O. BOX 450A
SANTA CLARA, CA 95052

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