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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
10/20/2009
Application #:
11935297
Filing Dt:
11/05/2007
Publication #:
Pub Dt:
05/01/2008
Inventors:
Majid Aghababazadeh, Jose J. Estabil, Nader Pakdaman, Gary L. Steinbrueck et al
Title:
INTRA-CHIP POWER AND TEST SIGNAL GENERATION FOR USE WITH TEST STRUCTURES ON WAFERS
Assignment: 1
Reel/Frame:
026934/0237Recorded: 09/20/2011Pages: 15
Conveyance:
SECURITY AGREEMENT
Assignor:
Exec Dt:
08/09/2010
Assignee:
3100 WEST WARREN AVENUE
FREMONT, CALIFORNIA 94538
Correspondent:
ERIC STRANG
2545 W. FRYE ROAD, SUITE 1
CHANDLER, AZ 85224
Assignment: 2
Reel/Frame:
041480/0910Recorded: 03/07/2017Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
02/26/2016
Assignee:
3100 WARREN AVE.
FREMONT, CALIFORNIA 94538
Correspondent:
TOKYO ELECTRON U.S. HOLDINGS, INC.
2400 GROVE BLVD.
AUSTIN, TX 78741

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